光的偏振信息在当前快速发展的光电子学和光学研究中是缺失的，利用偏振特征不仅可以提取探测物和研究对象的额外信息，而且延伸了探测的维度和提高了灵敏度。本文主要从基础研究和应用研究两个方面分析讨论红外偏振效应测量技术及红外遥感的若干进展，期望从不同的角度来考察偏振效应所带来的潜在应用。在上述背景下，本文介绍了红外椭圆偏振光谱技术及其在探测无机和有机薄膜体系光学性质的应用，并且归纳了红外偏振光学仪器理论及相关进展，特别是在空间遥感上的应用潜力。

This study described the infrared polarization effect, which is one of the polarization effects of high-resolution quantitative remote sensing instruments. The mechanism and new progress in instrument detection are summarized. Light polarization information is missing in the current rapid development of optoelectronics and optical studies. The polarization characteristics, which can be extracted using additional information based on the detected object and the object of study, extend the detection dimension and improve the sensitivity. Furthermore, the measurement technology of infrared polarization effect and some advances in infrared remote sensing mainly from the aspects of basic and applied research are summarized. Then, potential applications from different viewpoints to observe the polarization effect are discussed. In this context, the infrared spectroscopic ellipsometry and its applications in detecting the optical properties of inorganic and organic thin film systems are introduced. Finally, the theory and related progress of infrared polarization optical instruments are summarized, especially their potential applications in space remote sensing.